Scanning probe microscopy
Scanning probe microscopy measurements provide detailed characterization of materials properties on the atomic scale. In particular, scanning tunneling microscopy (STM) is capable of imaging the atomic lattice of a material, while scanning tunneling spectroscopy (STS) reveals its atomic-scale electronic structure. Research in our group focuses on the atomic-scale characterization and control of exotic electronic states of matter in a wide variety of vdW materials and heterostructures.